xref: /dpdk/app/test/test_ring_stress.c (revision 06e2856620a70000b2a28f0ea715fc247b85fd8d)
1 /* SPDX-License-Identifier: BSD-3-Clause
2  * Copyright(c) 2020 Intel Corporation
3  */
4 
5 #include "test_ring_stress.h"
6 
7 static int
8 run_test(const struct test *test)
9 {
10 	int32_t rc;
11 	uint32_t i, k;
12 
13 	for (i = 0, k = 0; i != test->nb_case; i++) {
14 
15 		printf("TEST-CASE %s %s START\n",
16 			test->name, test->cases[i].name);
17 
18 		rc = test->cases[i].func(test->cases[i].wfunc);
19 		k += (rc == 0);
20 
21 		if (rc != 0)
22 			printf("TEST-CASE %s %s FAILED\n",
23 				test->name, test->cases[i].name);
24 		else
25 			printf("TEST-CASE %s %s OK\n",
26 				test->name, test->cases[i].name);
27 	}
28 
29 	return k;
30 }
31 
32 static int
33 test_ring_stress(void)
34 {
35 	uint32_t n, k;
36 
37 	n = 0;
38 	k = 0;
39 
40 	n += test_ring_mpmc_stress.nb_case;
41 	k += run_test(&test_ring_mpmc_stress);
42 
43 	n += test_ring_rts_stress.nb_case;
44 	k += run_test(&test_ring_rts_stress);
45 
46 	n += test_ring_hts_stress.nb_case;
47 	k += run_test(&test_ring_hts_stress);
48 
49 	n += test_ring_mt_peek_stress.nb_case;
50 	k += run_test(&test_ring_mt_peek_stress);
51 
52 	n += test_ring_mt_peek_stress_zc.nb_case;
53 	k += run_test(&test_ring_mt_peek_stress_zc);
54 
55 	n += test_ring_st_peek_stress.nb_case;
56 	k += run_test(&test_ring_st_peek_stress);
57 
58 	n += test_ring_st_peek_stress_zc.nb_case;
59 	k += run_test(&test_ring_st_peek_stress_zc);
60 
61 	printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
62 		n, k, n - k);
63 	return (k != n);
64 }
65 
66 REGISTER_STRESS_TEST(ring_stress_autotest, test_ring_stress);
67