test/event: remove timer state check

Remove checking if timer state is set to RTE_EVENT_TIMER_NOT_ARMED
after the timer has expired as certain timer device implementations
might not have access to t

test/event: remove timer state check

Remove checking if timer state is set to RTE_EVENT_TIMER_NOT_ARMED
after the timer has expired as certain timer device implementations
might not have access to the rte_event_timer handle of a timer event.

Signed-off-by: Pavan Nikhilesh <pbhagavatula@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>

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eventdev/timer: fix timeout event wait behavior

Improved the accuracy and consistency of timeout event wait behavior by
refactoring it. Previously, the delay function used for waiting could be
inacc

eventdev/timer: fix timeout event wait behavior

Improved the accuracy and consistency of timeout event wait behavior by
refactoring it. Previously, the delay function used for waiting could be
inaccurate, leading to inconsistent results. This commit updates the
wait behavior to use a timeout-based approach, enabling the wait for the
exact number of timer ticks before proceeding.

The new function timeout_event_dequeue mimics the behavior of the tested
systems closely. It dequeues timer expiry events until either the
expected number of events have been dequeued or the specified time has
elapsed. The WAIT_TICKS macro defines the waiting behavior based on the
type of timer being used (software or hardware).

Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stable@dpdk.org

Signed-off-by: Shijith Thotton <sthotton@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>

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eventdev/timer: get remaining ticks

Introduce an event timer adapter API which allows users to determine how
many adapter ticks remain until an event timer expires.

Signed-off-by: Erik Gabriel Carr

eventdev/timer: get remaining ticks

Introduce an event timer adapter API which allows users to determine how
many adapter ticks remain until an event timer expires.

Signed-off-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>
Acked-by: Jerin Jacob <jerinj@marvell.com>

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test/event: fix build with clang 15

This variable is not used.

Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stable@dpdk.org

Signed-off-by: David Marchand <david.marchand@red

test/event: fix build with clang 15

This variable is not used.

Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stable@dpdk.org

Signed-off-by: David Marchand <david.marchand@redhat.com>
Acked-by: Tyler Retzlaff <roretzla@linux.microsoft.com>
Tested-by: Daxue Gao <daxuex.gao@intel.com>

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eventdev/timer: support periodic event timer

Add support to configure and use periodic event timers in
software timer adapter.

The structure ``rte_event_timer_adapter_stats`` is extended
by adding

eventdev/timer: support periodic event timer

Add support to configure and use periodic event timers in
software timer adapter.

The structure ``rte_event_timer_adapter_stats`` is extended
by adding a new field, ``evtim_drop_count``. This stat
represents the number of times an event_timer expiry event
is dropped by the event timer adapter.

Updated the software eventdev pmd timer_adapter_caps_get
callback function to report the support of periodic
event timer capability.

Signed-off-by: Naga Harish K S V <s.v.naga.harish.k@intel.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>

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test: skip unsupported tests on Windows

Skip tests which are not yet supported for Windows:
- The libraries that tests depend on are not enabled on Windows yet
- The tests can compile but with issue

test: skip unsupported tests on Windows

Skip tests which are not yet supported for Windows:
- The libraries that tests depend on are not enabled on Windows yet
- The tests can compile but with issue still under investigation
* test_func_reentrancy:
Windows EAL has no protection against repeated calls.
* test_lcores:
Execution enters an infinite loops, requires investigation.
* test_rcu_qsbr_perf:
Execution hangs on Windows, requires investigation.

Signed-off-by: Jie Zhou <jizh@linux.microsoft.com>
Signed-off-by: Dmitry Kozlyuk <dmitry.kozliuk@gmail.com>
Acked-by: Tyler Retzlaff <roretzla@linux.microsoft.com>

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app: remove unneeded atomic header include

Remove the unnecessary rte_atomic.h included in app modules.

Signed-off-by: Joyce Kong <joyce.kong@arm.com>
Reviewed-by: Ruifeng Wang <ruifeng.wang@arm.co

app: remove unneeded atomic header include

Remove the unnecessary rte_atomic.h included in app modules.

Signed-off-by: Joyce Kong <joyce.kong@arm.com>
Reviewed-by: Ruifeng Wang <ruifeng.wang@arm.com>

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test/event: fix timer adapter creation test

Removed freeing of unallocated mempool in event timer adapter create
unit test.

Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stabl

test/event: fix timer adapter creation test

Removed freeing of unallocated mempool in event timer adapter create
unit test.

Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stable@dpdk.org

Signed-off-by: Shijith Thotton <sthotton@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>

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test/event: fix result of unsupported periodic timer

Test case setup should return -ENOTSUP, if it is not supported.

Fixes: 7d761b07fcf6 ("test/event: add unit tests for periodic timer")
Cc: stable

test/event: fix result of unsupported periodic timer

Test case setup should return -ENOTSUP, if it is not supported.

Fixes: 7d761b07fcf6 ("test/event: add unit tests for periodic timer")
Cc: stable@dpdk.org

Signed-off-by: Shijith Thotton <sthotton@marvell.com>
Acked-by: Jerin Jacob <jerinj@marvell.com>

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test/event: add unit tests for periodic timer

Add tests to arm and cancel periodic timer.

Signed-off-by: Shijith Thotton <sthotton@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@inte

test/event: add unit tests for periodic timer

Add tests to arm and cancel periodic timer.

Signed-off-by: Shijith Thotton <sthotton@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>
Acked-by: Jerin Jacob <jerinj@marvell.com>

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test/event: fix timeout accuracy

Round timeout ticks when converting from nanoseconds, this prevents
loss of accuracy and deviation from requested timeout value.

Fixes: d1f3385d0076 ("test: add eve

test/event: fix timeout accuracy

Round timeout ticks when converting from nanoseconds, this prevents
loss of accuracy and deviation from requested timeout value.

Fixes: d1f3385d0076 ("test: add event timer adapter auto-test")
Cc: stable@dpdk.org

Signed-off-by: Pavan Nikhilesh <pbhagavatula@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>

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test: skip tests when missing requirements

Let's mark as skipped the tests when they are missing some requirements
like a number of used cores or specific hardware availability, like
compress, crypt

test: skip tests when missing requirements

Let's mark as skipped the tests when they are missing some requirements
like a number of used cores or specific hardware availability, like
compress, crypto or eventdev devices.

Signed-off-by: David Marchand <david.marchand@redhat.com>

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test/event: improve compatibility for timer adapter

Check if eventdev is open system eventdevs i.e. max_num_events = -1
before asserting.
Allow event timer adapter to adjust the resolution using
RTE

test/event: improve compatibility for timer adapter

Check if eventdev is open system eventdevs i.e. max_num_events = -1
before asserting.
Allow event timer adapter to adjust the resolution using
RTE_EVENT_TIMER_ADAPTER_F_ADJUST_RES and re-calculate timeout ticks
based on the adjusted resolution.

Signed-off-by: Pavan Nikhilesh <pbhagavatula@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>

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eventdev: check timer adapter status before start

Check if timer adapter is already started before starting it.
Update the unit test accordingly.

Signed-off-by: Pavan Nikhilesh <pbhagavatula@marvel

eventdev: check timer adapter status before start

Check if timer adapter is already started before starting it.
Update the unit test accordingly.

Signed-off-by: Pavan Nikhilesh <pbhagavatula@marvell.com>
Acked-by: Erik Gabriel Carrillo <erik.g.carrillo@intel.com>

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test: move to app directory

Since all other apps have been moved to the "app" folder, the autotest app
remains alone in the test folder. Rather than having an entire top-level
folder for this, we ca

test: move to app directory

Since all other apps have been moved to the "app" folder, the autotest app
remains alone in the test folder. Rather than having an entire top-level
folder for this, we can move it back to where it all started in early
versions of DPDK - the "app/" folder.

This move has a couple of advantages:
* This reduces clutter at the top level of the project, due to one less
folder.
* It eliminates the separate build task necessary for building the
autotests using make "make test-build" which means that developers are
less likely to miss something in their own compilation tests
* It re-aligns the final location of the test binary in the app folder when
building with make with it's location in the source tree.

For meson builds, the autotest app is different from the other apps in that
it needs a series of different test cases defined for it for use by "meson
test". Therefore, it does not get built as part of the main loop in the
app folder, but gets built separately at the end.

Signed-off-by: Bruce Richardson <bruce.richardson@intel.com>

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