xref: /dpdk/app/test/test_ring_mpmc_stress.c (revision 68a03efeed657e6e05f281479b33b51102797e15)
1 /* SPDX-License-Identifier: BSD-3-Clause
2  * Copyright(c) 2020 Intel Corporation
3  */
4 
5 #include "test_ring_stress_impl.h"
6 
7 static inline uint32_t
8 _st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
9 	uint32_t *avail)
10 {
11 	return rte_ring_mc_dequeue_bulk(r, obj, n, avail);
12 }
13 
14 static inline uint32_t
15 _st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
16 	uint32_t *free)
17 {
18 	return rte_ring_mp_enqueue_bulk(r, obj, n, free);
19 }
20 
21 static int
22 _st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
23 {
24 	return rte_ring_init(r, name, num, 0);
25 }
26 
27 const struct test test_ring_mpmc_stress = {
28 	.name = "MP/MC",
29 	.nb_case = RTE_DIM(tests),
30 	.cases = tests,
31 };
32