xref: /dpdk/app/test/test_bitops.c (revision 7917b0d38e92e8b9ec5a870415b791420e10f11a)
1 /* SPDX-License-Identifier: BSD-3-Clause
2  * Copyright(c) 2019 Arm Limited
3  * Copyright(c) 2024 Ericsson AB
4  */
5 
6 #include <inttypes.h>
7 #include <stdbool.h>
8 
9 #include <rte_bitops.h>
10 #include <rte_cycles.h>
11 #include <rte_launch.h>
12 #include <rte_lcore.h>
13 #include <rte_random.h>
14 #include "test.h"
15 
16 #define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun, flip_fun, test_fun, size, \
17 		mod) \
18 static int \
19 test_name(void) \
20 { \
21 	uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
22 	unsigned int bit_nr; \
23 	mod uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
24 	for (bit_nr = 0; bit_nr < size; bit_nr++) { \
25 		bool reference_bit = (reference >> bit_nr) & 1; \
26 		bool assign = rte_rand() & 1; \
27 		if (assign) { \
28 			assign_fun(&word, bit_nr, reference_bit); \
29 		} else { \
30 			if (reference_bit) \
31 				set_fun(&word, bit_nr); \
32 			else \
33 				clear_fun(&word, bit_nr); \
34 		} \
35 		TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
36 			"Bit %d had unexpected value", bit_nr); \
37 		flip_fun(&word, bit_nr); \
38 		TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
39 			"Bit %d had unflipped value", bit_nr); \
40 		flip_fun(&word, bit_nr); \
41 		const mod uint ## size ## _t *const_ptr = &word; \
42 		TEST_ASSERT(test_fun(const_ptr, bit_nr) == reference_bit, \
43 			"Bit %d had unexpected value", bit_nr); \
44 	} \
45 	for (bit_nr = 0; bit_nr < size; bit_nr++) { \
46 		bool reference_bit = (reference >> bit_nr) & 1; \
47 		TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
48 			"Bit %d had unexpected value", bit_nr); \
49 	} \
50 	TEST_ASSERT(reference == word, "Word had unexpected value"); \
51 	return TEST_SUCCESS; \
52 }
53 
54 GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear, rte_bit_assign, rte_bit_flip,
55 	rte_bit_test, 32,)
56 
57 GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear, rte_bit_assign, rte_bit_flip,
58 	rte_bit_test, 64,)
59 
60 GEN_TEST_BIT_ACCESS(test_bit_v_access32, rte_bit_set, rte_bit_clear, rte_bit_assign, rte_bit_flip,
61 	rte_bit_test, 32, volatile)
62 
63 GEN_TEST_BIT_ACCESS(test_bit_v_access64, rte_bit_set, rte_bit_clear, rte_bit_assign, rte_bit_flip,
64 	rte_bit_test, 64, volatile)
65 
66 #define bit_atomic_set(addr, nr) \
67 	rte_bit_atomic_set(addr, nr, rte_memory_order_relaxed)
68 
69 #define bit_atomic_clear(addr, nr) \
70 	rte_bit_atomic_clear(addr, nr, rte_memory_order_relaxed)
71 
72 #define bit_atomic_assign(addr, nr, value) \
73 	rte_bit_atomic_assign(addr, nr, value, rte_memory_order_relaxed)
74 
75 #define bit_atomic_flip(addr, nr) \
76 	rte_bit_atomic_flip(addr, nr, rte_memory_order_relaxed)
77 
78 #define bit_atomic_test(addr, nr) \
79 	rte_bit_atomic_test(addr, nr, rte_memory_order_relaxed)
80 
81 GEN_TEST_BIT_ACCESS(test_bit_atomic_access32, bit_atomic_set, bit_atomic_clear, bit_atomic_assign,
82 	bit_atomic_flip, bit_atomic_test, 32,)
83 
84 GEN_TEST_BIT_ACCESS(test_bit_atomic_access64, bit_atomic_set, bit_atomic_clear, bit_atomic_assign,
85 	bit_atomic_flip, bit_atomic_test, 64,)
86 
87 GEN_TEST_BIT_ACCESS(test_bit_atomic_v_access32, bit_atomic_set, bit_atomic_clear, bit_atomic_assign,
88 	bit_atomic_flip, bit_atomic_test, 32, volatile)
89 
90 GEN_TEST_BIT_ACCESS(test_bit_atomic_v_access64, bit_atomic_set, bit_atomic_clear, bit_atomic_assign,
91 	bit_atomic_flip, bit_atomic_test, 64, volatile)
92 
93 #define PARALLEL_TEST_RUNTIME 0.25
94 
95 #define GEN_TEST_BIT_PARALLEL_ASSIGN(size) \
96 struct parallel_access_lcore ## size \
97 { \
98 	unsigned int bit; \
99 	uint ## size ##_t *word; \
100 	bool failed; \
101 }; \
102 static int \
103 run_parallel_assign ## size(void *arg) \
104 { \
105 	struct parallel_access_lcore ## size *lcore = arg; \
106 	uint64_t deadline = rte_get_timer_cycles() + PARALLEL_TEST_RUNTIME * rte_get_timer_hz(); \
107 	bool value = false; \
108 	do { \
109 		bool new_value = rte_rand() & 1; \
110 		bool use_test_and_modify = rte_rand() & 1; \
111 		bool use_assign = rte_rand() & 1; \
112 		if (rte_bit_atomic_test(lcore->word, lcore->bit, \
113 					rte_memory_order_relaxed) != value) { \
114 			lcore->failed = true; \
115 			break; \
116 		} \
117 		if (use_test_and_modify) { \
118 			bool old_value; \
119 			if (use_assign) { \
120 				old_value = rte_bit_atomic_test_and_assign(lcore->word, \
121 					lcore->bit, new_value, rte_memory_order_relaxed); \
122 			} else { \
123 				old_value = new_value ? \
124 					rte_bit_atomic_test_and_set(lcore->word, lcore->bit, \
125 						rte_memory_order_relaxed) : \
126 					rte_bit_atomic_test_and_clear(lcore->word, lcore->bit, \
127 						rte_memory_order_relaxed); \
128 			} \
129 			if (old_value != value) { \
130 				lcore->failed = true; \
131 				break; \
132 			} \
133 		} else { \
134 			if (use_assign) { \
135 				rte_bit_atomic_assign(lcore->word, lcore->bit, new_value, \
136 					rte_memory_order_relaxed); \
137 			} else { \
138 				if (new_value) \
139 					rte_bit_atomic_set(lcore->word, lcore->bit, \
140 						rte_memory_order_relaxed); \
141 				else \
142 					rte_bit_atomic_clear(lcore->word, lcore->bit, \
143 						rte_memory_order_relaxed); \
144 			} \
145 		} \
146 		value = new_value; \
147 	} while (rte_get_timer_cycles() < deadline); \
148 	return 0; \
149 } \
150 static int \
151 test_bit_atomic_parallel_assign ## size(void) \
152 { \
153 	unsigned int worker_lcore_id; \
154 	uint ## size ## _t word = 0; \
155 	struct parallel_access_lcore ## size lmain = { .word = &word }; \
156 	struct parallel_access_lcore ## size lworker = { .word = &word }; \
157 	if (rte_lcore_count() < 2) { \
158 		printf("Need multiple cores to run parallel test.\n"); \
159 		return TEST_SKIPPED; \
160 	} \
161 	worker_lcore_id = rte_get_next_lcore(-1, 1, 0); \
162 	lmain.bit = rte_rand_max(size); \
163 	do { \
164 		lworker.bit = rte_rand_max(size); \
165 	} while (lworker.bit == lmain.bit); \
166 	int rc = rte_eal_remote_launch(run_parallel_assign ## size, &lworker, worker_lcore_id); \
167 	TEST_ASSERT(rc == 0, "Worker thread launch failed"); \
168 	run_parallel_assign ## size(&lmain); \
169 	rte_eal_mp_wait_lcore(); \
170 	TEST_ASSERT(!lmain.failed, "Main lcore atomic access failed"); \
171 	TEST_ASSERT(!lworker.failed, "Worker lcore atomic access failed"); \
172 	return TEST_SUCCESS; \
173 }
174 
175 GEN_TEST_BIT_PARALLEL_ASSIGN(32)
176 GEN_TEST_BIT_PARALLEL_ASSIGN(64)
177 
178 #define GEN_TEST_BIT_PARALLEL_TEST_AND_MODIFY(size) \
179 struct parallel_test_and_set_lcore ## size \
180 { \
181 	uint ## size ##_t *word; \
182 	unsigned int bit; \
183 	uint64_t flips; \
184 }; \
185 static int \
186 run_parallel_test_and_modify ## size(void *arg) \
187 { \
188 	struct parallel_test_and_set_lcore ## size *lcore = arg; \
189 	uint64_t deadline = rte_get_timer_cycles() + PARALLEL_TEST_RUNTIME * rte_get_timer_hz(); \
190 	do { \
191 		bool old_value; \
192 		bool new_value = rte_rand() & 1; \
193 		bool use_assign = rte_rand() & 1; \
194 		if (use_assign) \
195 			old_value = rte_bit_atomic_test_and_assign(lcore->word, lcore->bit, \
196 				new_value, rte_memory_order_relaxed); \
197 		else \
198 			old_value = new_value ? \
199 				rte_bit_atomic_test_and_set(lcore->word, lcore->bit, \
200 					rte_memory_order_relaxed) : \
201 				rte_bit_atomic_test_and_clear(lcore->word, lcore->bit, \
202 					rte_memory_order_relaxed); \
203 		if (old_value != new_value) \
204 			lcore->flips++; \
205 	} while (rte_get_timer_cycles() < deadline); \
206 	return 0; \
207 } \
208 static int \
209 test_bit_atomic_parallel_test_and_modify ## size(void) \
210 { \
211 	unsigned int worker_lcore_id; \
212 	uint ## size ## _t word = 0; \
213 	unsigned int bit = rte_rand_max(size); \
214 	struct parallel_test_and_set_lcore ## size lmain = { .word = &word, .bit = bit }; \
215 	struct parallel_test_and_set_lcore ## size lworker = { .word = &word, .bit = bit }; \
216 	if (rte_lcore_count() < 2) { \
217 		printf("Need multiple cores to run parallel test.\n"); \
218 		return TEST_SKIPPED; \
219 	} \
220 	worker_lcore_id = rte_get_next_lcore(-1, 1, 0); \
221 	int rc = rte_eal_remote_launch(run_parallel_test_and_modify ## size, &lworker, \
222 		worker_lcore_id); \
223 	TEST_ASSERT(rc == 0, "Worker thread launch failed"); \
224 	run_parallel_test_and_modify ## size(&lmain); \
225 	rte_eal_mp_wait_lcore(); \
226 	uint64_t total_flips = lmain.flips + lworker.flips; \
227 	bool expected_value = total_flips % 2; \
228 	TEST_ASSERT(expected_value == rte_bit_test(&word, bit), \
229 		"After %"PRId64" flips, the bit value should be %d", total_flips, expected_value); \
230 	uint ## size ## _t expected_word = 0; \
231 	rte_bit_assign(&expected_word, bit, expected_value); \
232 	TEST_ASSERT(expected_word == word, "Untouched bits have changed value"); \
233 	return TEST_SUCCESS; \
234 }
235 
236 GEN_TEST_BIT_PARALLEL_TEST_AND_MODIFY(32)
237 GEN_TEST_BIT_PARALLEL_TEST_AND_MODIFY(64)
238 
239 #define GEN_TEST_BIT_PARALLEL_FLIP(size) \
240 struct parallel_flip_lcore ## size \
241 { \
242 	uint ## size ##_t *word; \
243 	unsigned int bit; \
244 	uint64_t flips; \
245 }; \
246 static int \
247 run_parallel_flip ## size(void *arg) \
248 { \
249 	struct parallel_flip_lcore ## size *lcore = arg; \
250 	uint64_t deadline = rte_get_timer_cycles() + PARALLEL_TEST_RUNTIME * rte_get_timer_hz(); \
251 	do { \
252 		rte_bit_atomic_flip(lcore->word, lcore->bit, rte_memory_order_relaxed); \
253 		lcore->flips++; \
254 	} while (rte_get_timer_cycles() < deadline); \
255 	return 0; \
256 } \
257 static int \
258 test_bit_atomic_parallel_flip ## size(void) \
259 { \
260 	unsigned int worker_lcore_id; \
261 	uint ## size ## _t word = 0; \
262 	unsigned int bit = rte_rand_max(size); \
263 	struct parallel_flip_lcore ## size lmain = { .word = &word, .bit = bit }; \
264 	struct parallel_flip_lcore ## size lworker = { .word = &word, .bit = bit }; \
265 	if (rte_lcore_count() < 2) { \
266 		printf("Need multiple cores to run parallel test.\n"); \
267 		return TEST_SKIPPED; \
268 	} \
269 	worker_lcore_id = rte_get_next_lcore(-1, 1, 0); \
270 	int rc = rte_eal_remote_launch(run_parallel_flip ## size, &lworker, worker_lcore_id); \
271 	TEST_ASSERT(rc == 0, "Worker thread launch failed"); \
272 	run_parallel_flip ## size(&lmain); \
273 	rte_eal_mp_wait_lcore(); \
274 	uint64_t total_flips = lmain.flips + lworker.flips; \
275 	bool expected_value = total_flips % 2; \
276 	TEST_ASSERT(expected_value == rte_bit_test(&word, bit), \
277 		"After %"PRId64" flips, the bit value should be %d", total_flips, expected_value); \
278 	uint ## size ## _t expected_word = 0; \
279 	rte_bit_assign(&expected_word, bit, expected_value); \
280 	TEST_ASSERT(expected_word == word, "Untouched bits have changed value"); \
281 	return TEST_SUCCESS; \
282 }
283 
284 GEN_TEST_BIT_PARALLEL_FLIP(32)
285 GEN_TEST_BIT_PARALLEL_FLIP(64)
286 
287 static uint32_t val32;
288 static uint64_t val64;
289 
290 #define MAX_BITS_32 32
291 #define MAX_BITS_64 64
292 
293 /*
294  * Bitops functions
295  * ================
296  *
297  * - The main test function performs several subtests.
298  * - Check bit operations on one core.
299  *   - Initialize valXX to specified values, then set each bit of valXX
300  *     to 1 one by one in "test_bit_relaxed_set".
301  *
302  *   - Clear each bit of valXX to 0 one by one in "test_bit_relaxed_clear".
303  *
304  *   - Function "test_bit_relaxed_test_set_clear" checks whether each bit
305  *     of valXX can do "test and set" and "test and clear" correctly.
306  */
307 
308 static int
309 test_bit_relaxed_set(void)
310 {
311 	unsigned int i;
312 
313 	for (i = 0; i < MAX_BITS_32; i++)
314 		rte_bit_relaxed_set32(i, &val32);
315 
316 	for (i = 0; i < MAX_BITS_32; i++)
317 		if (!rte_bit_relaxed_get32(i, &val32)) {
318 			printf("Failed to set bit in relaxed version.\n");
319 			return TEST_FAILED;
320 		}
321 
322 	for (i = 0; i < MAX_BITS_64; i++)
323 		rte_bit_relaxed_set64(i, &val64);
324 
325 	for (i = 0; i < MAX_BITS_64; i++)
326 		if (!rte_bit_relaxed_get64(i, &val64)) {
327 			printf("Failed to set bit in relaxed version.\n");
328 			return TEST_FAILED;
329 		}
330 
331 	return TEST_SUCCESS;
332 }
333 
334 static int
335 test_bit_relaxed_clear(void)
336 {
337 	unsigned int i;
338 
339 	for (i = 0; i < MAX_BITS_32; i++)
340 		rte_bit_relaxed_clear32(i, &val32);
341 
342 	for (i = 0; i < MAX_BITS_32; i++)
343 		if (rte_bit_relaxed_get32(i, &val32)) {
344 			printf("Failed to clear bit in relaxed version.\n");
345 			return TEST_FAILED;
346 		}
347 
348 	for (i = 0; i < MAX_BITS_64; i++)
349 		rte_bit_relaxed_clear64(i, &val64);
350 
351 	for (i = 0; i < MAX_BITS_64; i++)
352 		if (rte_bit_relaxed_get64(i, &val64)) {
353 			printf("Failed to clear bit in relaxed version.\n");
354 			return TEST_FAILED;
355 		}
356 
357 	return TEST_SUCCESS;
358 }
359 
360 static int
361 test_bit_relaxed_test_set_clear(void)
362 {
363 	unsigned int i;
364 
365 	for (i = 0; i < MAX_BITS_32; i++)
366 		rte_bit_relaxed_test_and_set32(i, &val32);
367 
368 	for (i = 0; i < MAX_BITS_32; i++)
369 		if (!rte_bit_relaxed_test_and_clear32(i, &val32)) {
370 			printf("Failed to set and test bit in relaxed version.\n");
371 			return TEST_FAILED;
372 	}
373 
374 	for (i = 0; i < MAX_BITS_32; i++)
375 		if (rte_bit_relaxed_get32(i, &val32)) {
376 			printf("Failed to test and clear bit in relaxed version.\n");
377 			return TEST_FAILED;
378 		}
379 
380 	for (i = 0; i < MAX_BITS_64; i++)
381 		rte_bit_relaxed_test_and_set64(i, &val64);
382 
383 	for (i = 0; i < MAX_BITS_64; i++)
384 		if (!rte_bit_relaxed_test_and_clear64(i, &val64)) {
385 			printf("Failed to set and test bit in relaxed version.\n");
386 			return TEST_FAILED;
387 		}
388 
389 	for (i = 0; i < MAX_BITS_64; i++)
390 		if (rte_bit_relaxed_get64(i, &val64)) {
391 			printf("Failed to test and clear bit in relaxed version.\n");
392 			return TEST_FAILED;
393 		}
394 
395 	return TEST_SUCCESS;
396 }
397 
398 static struct unit_test_suite test_suite = {
399 	.suite_name = "Bitops test suite",
400 	.unit_test_cases = {
401 		TEST_CASE(test_bit_access32),
402 		TEST_CASE(test_bit_access64),
403 		TEST_CASE(test_bit_access32),
404 		TEST_CASE(test_bit_access64),
405 		TEST_CASE(test_bit_v_access32),
406 		TEST_CASE(test_bit_v_access64),
407 		TEST_CASE(test_bit_atomic_access32),
408 		TEST_CASE(test_bit_atomic_access64),
409 		TEST_CASE(test_bit_atomic_v_access32),
410 		TEST_CASE(test_bit_atomic_v_access64),
411 		TEST_CASE(test_bit_atomic_parallel_assign32),
412 		TEST_CASE(test_bit_atomic_parallel_assign64),
413 		TEST_CASE(test_bit_atomic_parallel_test_and_modify32),
414 		TEST_CASE(test_bit_atomic_parallel_test_and_modify64),
415 		TEST_CASE(test_bit_atomic_parallel_flip32),
416 		TEST_CASE(test_bit_atomic_parallel_flip64),
417 		TEST_CASE(test_bit_relaxed_set),
418 		TEST_CASE(test_bit_relaxed_clear),
419 		TEST_CASE(test_bit_relaxed_test_set_clear),
420 		TEST_CASES_END()
421 	}
422 };
423 
424 static int
425 test_bitops(void)
426 {
427 	return unit_test_suite_runner(&test_suite);
428 }
429 
430 REGISTER_FAST_TEST(bitops_autotest, true, true, test_bitops);
431