xref: /dpdk/app/test-bbdev/main.h (revision 089e5ed727a15da2729cfee9b63533dd120bd04c)
1 /* SPDX-License-Identifier: BSD-3-Clause
2  * Copyright(c) 2017 Intel Corporation
3  */
4 
5 #ifndef _MAIN_H_
6 #define _MAIN_H_
7 
8 #include <stddef.h>
9 #include <sys/queue.h>
10 
11 #include <rte_common.h>
12 #include <rte_hexdump.h>
13 #include <rte_log.h>
14 
15 #define TEST_SUCCESS    0
16 #define TEST_FAILED     -1
17 #define TEST_SKIPPED    1
18 
19 #define MAX_BURST 512U
20 #define DEFAULT_BURST 32U
21 #define DEFAULT_OPS 64U
22 
23 
24 #define TEST_ASSERT(cond, msg, ...) do {  \
25 		if (!(cond)) {  \
26 			printf("TestCase %s() line %d failed: " \
27 				msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
28 			return TEST_FAILED;  \
29 		} \
30 } while (0)
31 
32 /* Compare two buffers (length in bytes) */
33 #define TEST_ASSERT_BUFFERS_ARE_EQUAL(a, b, len, msg, ...) do { \
34 	if (memcmp((a), (b), len)) { \
35 		printf("TestCase %s() line %d failed: " \
36 			msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
37 		rte_memdump(stdout, "Buffer A", (a), len); \
38 		rte_memdump(stdout, "Buffer B", (b), len); \
39 		return TEST_FAILED; \
40 	} \
41 } while (0)
42 
43 #define TEST_ASSERT_SUCCESS(val, msg, ...) do { \
44 		typeof(val) _val = (val); \
45 		if (!(_val == 0)) { \
46 			printf("TestCase %s() line %d failed (err %d): " \
47 				msg "\n", __func__, __LINE__, _val, \
48 				##__VA_ARGS__); \
49 			return TEST_FAILED; \
50 		} \
51 } while (0)
52 
53 #define TEST_ASSERT_FAIL(val, msg, ...) \
54 	TEST_ASSERT_SUCCESS(!(val), msg, ##__VA_ARGS__)
55 
56 #define TEST_ASSERT_NOT_NULL(val, msg, ...) do { \
57 		if ((val) == NULL) { \
58 			printf("TestCase %s() line %d failed (null): " \
59 				msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
60 			return TEST_FAILED;  \
61 		} \
62 } while (0)
63 
64 struct unit_test_case {
65 	int (*setup)(void);
66 	void (*teardown)(void);
67 	int (*testcase)(void);
68 	const char *name;
69 };
70 
71 #define TEST_CASE(testcase) {NULL, NULL, testcase, #testcase}
72 
73 #define TEST_CASE_ST(setup, teardown, testcase) \
74 		{setup, teardown, testcase, #testcase}
75 
76 #define TEST_CASES_END() {NULL, NULL, NULL, NULL}
77 
78 struct unit_test_suite {
79 	const char *suite_name;
80 	int (*setup)(void);
81 	void (*teardown)(void);
82 	struct unit_test_case unit_test_cases[];
83 };
84 
85 int unit_test_suite_runner(struct unit_test_suite *suite);
86 
87 typedef int (test_callback)(void);
88 TAILQ_HEAD(test_commands_list, test_command);
89 struct test_command {
90 	TAILQ_ENTRY(test_command) next;
91 	const char *command;
92 	test_callback *callback;
93 };
94 
95 void add_test_command(struct test_command *t);
96 
97 /* Register a test function */
98 #define REGISTER_TEST_COMMAND(name, testsuite) \
99 	static int test_func_##name(void) \
100 	{ \
101 		return unit_test_suite_runner(&testsuite); \
102 	} \
103 	static struct test_command test_struct_##name = { \
104 		.command = RTE_STR(name), \
105 		.callback = test_func_##name, \
106 	}; \
107 	static void __attribute__((constructor, used)) \
108 	test_register_##name(void) \
109 	{ \
110 		add_test_command(&test_struct_##name); \
111 	}
112 
113 const char *get_vector_filename(void);
114 
115 unsigned int get_num_ops(void);
116 
117 unsigned int get_burst_sz(void);
118 
119 unsigned int get_num_lcores(void);
120 
121 bool get_init_device(void);
122 
123 #endif
124