xref: /dpdk/app/test/test_ring_stress.h (revision f72299fd157deee129c5d8415f9a58b1af0bf84c)
1 /* SPDX-License-Identifier: BSD-3-Clause
2  * Copyright(c) 2020 Intel Corporation
3  */
4 
5 
6 #include <inttypes.h>
7 #include <stddef.h>
8 #include <stdalign.h>
9 #include <string.h>
10 #include <stdio.h>
11 #include <unistd.h>
12 
13 #include <rte_ring.h>
14 #include <rte_cycles.h>
15 #include <rte_launch.h>
16 #include <rte_pause.h>
17 #include <rte_random.h>
18 #include <rte_malloc.h>
19 #include <rte_spinlock.h>
20 
21 #include "test.h"
22 
23 struct test_case {
24 	const char *name;
25 	int (*func)(int (*)(void *));
26 	int (*wfunc)(void *arg);
27 };
28 
29 struct test {
30 	const char *name;
31 	uint32_t nb_case;
32 	const struct test_case *cases;
33 };
34 
35 extern const struct test test_ring_mpmc_stress;
36 extern const struct test test_ring_rts_stress;
37 extern const struct test test_ring_hts_stress;
38 extern const struct test test_ring_mt_peek_stress;
39 extern const struct test test_ring_mt_peek_stress_zc;
40 extern const struct test test_ring_st_peek_stress;
41 extern const struct test test_ring_st_peek_stress_zc;
42