xref: /dpdk/app/test-compress-perf/comp_perf_test_throughput.h (revision 2695db95a1474e07d0105d31b9c52562dc6fb89a)
1 /* SPDX-License-Identifier: BSD-3-Clause
2  * Copyright(c) 2018 Intel Corporation
3  */
4 
5 #ifndef _COMP_PERF_TEST_BENCHMARK_
6 #define _COMP_PERF_TEST_BENCHMARK_
7 
8 #include <stdint.h>
9 
10 #include "comp_perf_options.h"
11 #include "comp_perf_test_common.h"
12 #include "comp_perf_test_verify.h"
13 
14 struct cperf_benchmark_ctx {
15 	struct cperf_verify_ctx ver;
16 
17 	/* Store TSC duration for all levels (including level 0) */
18 	uint64_t comp_tsc_duration[RTE_COMP_LEVEL_MAX + 1];
19 	uint64_t decomp_tsc_duration[RTE_COMP_LEVEL_MAX + 1];
20 	double comp_gbps;
21 	double decomp_gbps;
22 	double comp_tsc_byte;
23 	double decomp_tsc_byte;
24 };
25 
26 void
27 cperf_throughput_test_destructor(void *arg);
28 
29 int
30 cperf_throughput_test_runner(void *test_ctx);
31 
32 void *
33 cperf_throughput_test_constructor(uint8_t dev_id, uint16_t qp_id,
34 		struct comp_test_data *options);
35 
36 #endif
37